rexresearch.com
James
CORNWELL
Directed Energy Jamming
System
www.rustumroy.com
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WO2009064397
DIRECTED-ENERGY SYSTEMS AND
METHODS FOR DISRUPTING ELECTRONIC CIRCUITS
2009-05-22
Inventor(s): CORNWELL JAMES [US] + (CORNWELL,
JAMES)
Classification: - international: H01J37/30;
H01J37/30 - European: G21K5/00
Abstract -- Disclosed are
directed-energy systems and methods for disrupting electronic
circuits, especially those containing semiconductors. A
directed-energy system can include a charged particle generator
configured to generate plural energized particles and a charge
transformer configured to receive the plural energized particles
that include charged particles and to output energized particles
that include particles having substantially zero charge. The
charged particle generator can be configured to direct the plural
energized particles through the charge transformer in a predefined
direction. A method for disrupting electronic circuits can include
generating plural energized particles, directing the plural
energized particles to an incident surface of a charge transformer
and transforming the plural energized particles within the charge
transformer.; The transformed particles can be at substantially
zero charge. The method can further include generating a wavefront
at an exit surface of the charge transformer including the
transformed particles and impinging an electronic circuit with the
wavefront.
CROSS-REFERENCE TO RELATED
APPLICATIONS
[0001] This application claims priority from U.S. Provisional
Patent Application
Serial No. 60/987,691 , filed November 13, 2007, the disclosure of
which is hereby incorporated by reference in its entirety. This
application also incorporates by reference in its entirety U.S.
Provisional Patent Application Serial No. 61/113,847, filed
November 12, 2008.
BACKGROUND
Field
[0002] The subject matter presented herein relates generally to
directed- energy systems and methods, and more particularly, to
directed-energy systems and methods for disrupting electronic
circuits, especially those containing semiconductors.
Description of Related Art
[0003] The configuration and operation of known directed-energy
devices can vary widely, as is illustrated by the disclosures of
U.S. Patent Nos. 6,809,307; 6,784,408; 6,849,841 ; 6,864,825 and
7,126,530, which are incorporated herein by reference in their
entirety.
[0004] Known directed-energy devices can produce, for example,
electromagnetic waves (EMW) and electromagnetic pulses (EMP),
which propagate away from a source with diminishing intensity,
governed by the theory of electromagnetism. An electromagnetic
pulse (EMP) is in effect an electromagnetic shock wave.
[0005] This pulse of energy can produce a powerful electromagnetic
field. The field can be sufficiently strong to produce short lived
transient voltages of potentially thousands of volts on exposed
electrical conductors, such as wires, or conductive tracks on
printed circuit boards, where exposed.
[0006] The EMP effect can result in irreversible damage to a wide
range of electrical and electronic equipment, particularly
computers and radio or radar receivers. Subject to the
electromagnetic hardness of the electronics, a measure of the
equipment's resilience to this effect, and the intensity of the
field produced, the equipment can be irreversibly damaged or in
effect electrically destroyed. The damage inflicted is not unlike
that experienced through exposure to close proximity lightning
strikes, and may require complete replacement of the equipment, or
at least substantial portions thereof.
[0007] Known computer and telecommunications equipment can be
particularly vulnerable to EMP effects, as it is largely built up
of high density Metal Oxide Semiconductor (MOS) devices, for
instance, which can be very sensitive to exposure to high voltage
transients. What can be significant about MOS devices is that very
little energy is required to permanently damage or destroy them.
Any voltage typically in excess of ten or tens of volts can
produce an effect termed gate breakdown that effectively destroys
the device. Even if a voltage pulse is not powerful enough to
produce thermal damage, the power supply in the equipment can
readily supply enough energy to complete the destructive process.
Damaged devices may still function, but their reliability may be
seriously impaired, or not function as intended or at all.
[0008] Shielding electronics by equipment chassis can provide
limited protection, as any cables running in and out of the
equipment can behave very much like antennae, in effect guiding
the high voltage transients into the equipment.
[0009] Computers used in data processing systems, communications
systems, displays, industrial control applications, including road
and rail signaling, and those embedded in military equipment, such
as signal processors, electronic flight controls and digital
engine control systems, are all potentially vulnerable to the EMP
effect.
[0010] Receivers can be particularly sensitive to EMP, as the
highly sensitive miniature high frequency transistors and diodes
in such equipment can be easily destroyed by exposure to high
voltage electrical transients. Therefore, radar and electronic
warfare equipment, satellite, microwave, UHF, VHF, HF and low band
communications equipment and television equipment are all
potentially vulnerable to the EMP effect.
[0011] A known effective countermeasure method to protect against
the harmful effects of electromagnetism is to wholly contain
equipment in an electrically conductive enclosure, termed a
Faraday cage, which can prevent the electromagnetic field from
gaining access to the protected equipment. A Faraday cage can be
capable of stopping an attack using electromagnetism, such as an
EMP. SUMMARY
[0012] In an exemplary embodiment, a directed-energy system
includes a charged particle generator configured to generate
plural energized particles; and a charge transformer configured to
receive the plural energized particles that include charged
particles from the charged particle generator and to output
energized particles that include particles having substantially
zero charge, wherein the charged particle generator is configured
to direct the plural energized particles through the charge
transformer in a predefined direction.
[0013] An exemplary method of disrupting an electronic circuit can
include generating plural energized particles; directing the
plural energized particles to an incident surface of a charge
transformer; transforming the plural energized particles within
the charge transformer, wherein the transformed particles are at
substantially zero charge; generating a wavefront at an exit
surface of the charge transformer comprising the transformed
particles at substantially zero charge; and impinging an
electronic circuit with the wavefront comprising the transformed
particles at substantially zero charge.
BRIEF DESCRIPTION OF THE DRAWINGS
[0014] As will be realized, different embodiments are possible,
and the details disclosed herein are capable of modification in
various respects, all without departing from the scope of the
claims. Accordingly, the drawings and descriptions are to be
regarded as illustrative in nature and not as restrictive. Like
reference numerals have been used to designate like elements.
[0015]
FIG. 1 shows a
functional block diagram of an exemplary embodiment of a
directed-energy system.
[0016]
FIG. 2 shows a
simplified cross-sectional view of portions of an exemplary
embodiment of a directed-energy system.
DETAILED DESCRIPTION
[0017] Referring to FIGs. 1 and 2, an exemplary embodiment of a
directed- energy system can include a charged particle generator
100 configured to generate plural energized particles and a charge
transformer 114 configured to receive the plural energized
particles that include charged particles from the charged particle
generator and to output energized particles that include particles
having substantially zero charge. The charged particle generator
100 can be configured to direct the plural energized particles
through the charge transformer 114 in a predefined direction,
e.g., toward a target device. In an exemplary embodiment, the
plural energized particles can be in the form of a photon particle
wave, e.g., a mixture or cross-generation of photons and
electrons.
[0018] Power and control components will be known to those of
skill in the art. For example, in an exemplary embodiment,
energized particle generator 100 can include a DC power supply 102
and DC-to-AC converter 104.
[0019] In an exemplary embodiment, charged particle generator 100
can include charged particle emitter 106. In an embodiment,
charged particle emitter 106 can include any source of radio
frequency energy, particularly microwaves. In some embodiments,
charged particle emitter 106 may include known magnetrons. In some
other embodiments, charged particle emitter 106 may include
solid-state power amplifiers, gyrotrons, traveling wave tubes
(TWTs)1 and/or klystrons. In some embodiments, charged particle
emitter 106 may be a lower-power source and may generate energy
levels of approximately 1 kilowatt (kW) to approximately 100 kW or
greater, although the scope is not limited in this respect.
[0020] Without limiting the scope of the invention, other examples
of suitable charged particle emitters that can form a photon
particle wave include known energy emission devices such as free
electron lasers and discharges or arcs at edges of planar
antennae, for example, spark gap generators.
[0021] In some embodiments, charged particle emitter 106 may
include a free electron laser, or FEL. A FEL is a laser that
shares the same optical properties as conventional lasers such as
emitting a beam consisting of coherent electromagnetic radiation
which can reach high power, but which uses some very different
operating principles to form the beam. Unlike gas, liquid, or
solid-state lasers such as diode lasers, which rely on bound
atomic or molecular states, FELs use a relativistic electron beam
as the lasing medium, hence the term free electron. This gives
them a wide frequency range compared to other laser types, and
makes many of them widely tunable, currently ranging in wavelength
from microwaves, through terahertz radiation and infrared, to the
visible spectrum, to ultraviolet, to soft X-rays.
[0022] In an exemplary embodiment, charged particle emitter 106
can include an excitation signal, produced by known signal
generation devices, for example. Such an excitation signal could
be a 120 VAC clipped (square) wave that can have an effect of
driving a magnetron outside of a typical 2.45 GHz frequency, for
example. In an embodiment, when a 120 VAC square wave excitation
signal is applied to a magnetron, bandwidths on the order of 0 to
10 GHz can be achieved.
[0023] In an exemplary embodiment, the output of charged particle
emitter 106 can be a photon particle wave that can include a
mixture of photons and electrons.
[0024] In an exemplary embodiment, charged particle generator 100
can include an energized particle, e.g., photon and/or particle
beam or wave, forming module 108. In an exemplary embodiment,
energized particle (photon particle beam or wave) forming module
108 can be positioned in a throat section of a waveguide launcher
between charged particle emitter 106 and waveguide 110.
[0025] In an exemplary embodiment, energized particle forming
module 108 can be made of an electropositive material, such as a
polycarbonate sheet. In an embodiment, this material can include
DELRIN manufactured by DuPont. In an embodiment, energized
particle forming module 108 can act like a roughing filter, i.e.,
it can start the process of reducing the charge of the charged
particles in the mixture of photons and electrons. After passing
through energized particle forming module 108, the mixture of
photons and electrons can then be directed via waveguide 110 as an
electromagnetic wavefront 112 to impinge on the surface of charge
transformer 114.
[0026] In an exemplary embodiment, waveguide 110 can include a
hollow conducting tube, which may be rectangular or circular, for
example, within which EM waves can be propagated. Signals can
propagate within the confines of metallic walls, for example, that
act as boundaries.
[0027] In an exemplary embodiment, waveguide 110 can be configured
as a circularly polarized antenna and may radiate substantially
circularly polarized energy. In other embodiments, waveguide 110
may be linearly polarized and may radiate signals with a linear
polarization (e.g., a horizontal and/or a vertical polarization).
Antennas in many shapes, such as horns, lenses, planar arrays, and
reflectors may be suitable in some of these embodiments.
[0028] As shown in FIG. 2, exemplary waveguide 110 can be
configured as part of a device that can include a magnetron
portion, a throat section of a waveguide launcher area that can
include energized particle forming module 108 positioned between
charged particle emitter 106 and waveguide 110, and a cone-like
portion or horn. In an exemplary embodiment, a magnetron can be
placed in the magnetron portion such that there can be a
three-inch gap between the top of the magnetron's cathode and the
top of the enclosure.
[0029] In an exemplary and non-limiting embodiment, waveguide 110
can be designed to promote sufficient velocity of the photon
particle wave that can include a mixture of photons and electrons
particles, here designated as EM wavefront 112, moving through the
waveguide 110. Again referring to FIG. 2, x refers to a length of
exemplary waveguide 110 (which can include energized particle
forming module 108) and y refers to a height of an aperture
opening at the end of waveguide 110. In an exemplary embodiment,
the ratio of x/y can be approximately 3 to 3.5 to 1 to promote
sufficient velocity of the particles moving through the waveguide
110. For example, assuming that the aperture opening height (y) is
six inches, then waveguide 110 length can be from 18 to 21 inches.
In another embodiment, a length of waveguide 110 can be based on
the ratio of six times the air gap above an exemplary magnetron's
cathode. Using the previously mentioned three-inch gap, this
results in a waveguide length of eighteen inches.
[0030] In an exemplary embodiment, the aperture opening can be
generally rectangular. In an embodiment, the aperture opening
width can be eight inches for an aperture opening height (y) of
six inches. In an exemplary embodiment, the length of the launcher
area before the waveguide 110 can be approximately two inches.
[0031] In an exemplary embodiment, the interior surface of
exemplary waveguide 110 can be coated with approximately two mils
(0.002 inches) of a noble metal, such as 14-carat gold. Other
noble metals can include ruthenium, rhodium, palladium, osmium,
iridium and platinum. Such a coating can improve the gain
characteristics of waveguide 110. An example of a suitable coating
process that can be used to enhance the performance of antennas or
waveguides may be found in U.S. Patent No. 7,221 ,329, the
disclosure of which is hereby incorporated by reference in its
entirety.
[0032] In an embodiment, waveguide 110 can be configured to
minimize backscatter of the energized particles using known
techniques.
[0033] In an exemplary embodiment, EM wavefront 112 can be
directed through charge transformer 114. In an embodiment, charge
transformer 112 can have dielectric and physical characteristics
such that the energized charged particles, e.g., electrons, in an
EM wavefront 112 can be transformed. While not wishing to be bound
by any particular theory, this may be done either by changing
characteristics of the particle, or by generation or emission of
different particles as a result thereof, thereby creating a
wavefront 116 at the output of the charge transformer 114.
Wavefront 116 can propagate toward a target device, e.g., a device
containing an electronic circuit including a semiconductor. In an
exemplary embodiment, wavefront 116 with energized particles can
be focused and can be of high enough energy to allow for
operations in, for example, a space of approximately 20 feet x 30
feet. In an exemplary embodiment, a 600 W magnetron can produce a
wavefront 116 of about 10 mW/cm<2> at the aperture, which
can result in about 2 mW/cm<2> at 1 meter from the aperture,
which can be an effective range for an embodiment.
[0034] In an exemplary embodiment, charge transformer 114 can
include an incident surface for receiving the EM wavefront 112 and
an exit surface for radiating the wavefront 116.
[0035] In an exemplary embodiment, charge transformer 114 can
include a composite of glass and/or polycarbonate materials, for
example, and can vary in shape. For example, flat plates or panes
with parallel surfaces can be used as well as convex lenses of a
desired focal length. Hybrid configurations with parallel surfaces
at the center and convex surfaces at the edges can also be
acceptable configurations.
[0036] Referring to FIG. 2, in an exemplary embodiment, charge
transformer 114 can include at least one
electronegative/electropositive material pair, i.e., an
electronegative layer next to an electropositive layer, or vice
versa, that first receives EM wavefront 112, followed by
approximately 1/2 inch of glass or quartz, followed by two
electronegative layers. In an exemplary embodiment, this assembly
of layers can be vacuum-sealed in ABS plastic.
[0037] Suitable materials for the electronegative/electropositive
material pair can include known materials that can exhibit
electronegative/electropositive behavior. As previously mentioned,
an electropositive material can include a polycarbonate sheet made
of DELRIN, for example. Suitable polycarbonate can also be chosen
for electronegative layers. In another embodiment, plate glass can
be sputtered with metal oxides to achieve desired
electronegative/electropositive behavior.
[0038] In an exemplary embodiment, the approximately 1/2 inch of
glass layer can include leaded glass if additional dampening of
the emitted zero-charge particle stream is desired.
[0039] In an exemplary embodiment, there can be plural pairs of
electronegative/electropositive material that first receives EM
wavefront 112 followed by a glass or quartz layer.
[0040] In an exemplary embodiment, horizontal and/or vertical
slits or other openings can be formed into or cut out of charge
transformer 114 so that in addition to wavefront 116 propagating
from charge transformer 114, charged particles in EM wavefront 112
can also propagate from the device. A controlled amount of charged
particles along with wavefront 116 may be useful depending on the
operating environment. In an exemplary embodiment, the slits or
other openings may be adjustable by an operator using known
methods and/or materials. For example, tape, a slide mechanism, or
an aperture mechanism could be used to adjust the slits. [0041]
Charge transformer 114 may incorporate known coating materials or
multiple deposition layers on either the incident surface or the
exit surface to aid in the wavefront 116 generation, and/or have
abrasion or polishing performed on either surface to enhance
desired characteristics of the charge transformer 114. Similarly,
side surfaces may have similar operations performed to enhance the
desired charge transformer 114 characteristics. Other compositions
materials and combinations of materials may be used in the
fabrication of the charge transformer 114 to achieve desired
transformation effects. Additionally, other geometries may be used
for charge transformer 114, including, without limitation,
stacking additional charge transformer components in combinations
that may reflect, refract or redirect EM wavefront 112.
[0042] In an exemplary embodiment, wavefront 116, after exiting
charge transformer 114, is shown in FIG. 2 impinging on a target
device, which in an exemplary embodiment can be up to one meter
away. Wavefront 116 can propagate through free space until it
impinges an electronic device where it can disrupt the operation
of semiconductors therein, for example.
[0043] In an exemplary embodiment, a sighting device, such as a
laser rifle scope or sight, can be incorporated into an exemplary
directed-energy system and used to help direct the wavefront 116.
[0044] An exemplary method for disrupting the operation of an
electronic device can include generating plural energized
particles, directing the plural energized particles to an incident
surface of a charge transformer and transforming the plural
energized particles within the charge transformer. The transformed
particles can be at substantially zero charge and include
substantially zero charge particles. A method can further include
generating a wavefront at an exit surface of the charge
transformer comprising the transformed particles at substantially
zero charge and impinging an electronic circuit with the wavefront
comprising the transformed particles at substantially zero charge.
[0045] Transforming the plural energized particles within the
charge transformer can include laterally aligning the plural
energized particles to produce a polarization of the plural
energized particles. The plural energized particles can be
generated by cross-generation of photons and electrons.
[0046] Various system components described above may be resized
depending on the system parameters desired. For example, charge
transformer 114 and waveguide 110 can be made larger or smaller
and can have different dimensions and geometries depending, for
example, on the power or distance requirements of a particular
application. Exemplary directed-energy systems can be sized for
operation within a room, e.g., a floor space of approximately 20
feet x 30 feet. Additionally, an exemplary charged particle
emitter 106 may be configured by those skilled in the art to have
multiple voltages, frequencies, and power levels.
[0047] The precise theory of operation of the charged particle
generator 100 in combination with the charge transformer 114 is
not entirely understood. Without wishing to be bound by any
theory, it is believed that the charge transformer 114 reduces the
charge in the EM wavefront 112. Based on empirical data to date,
it has been determined through experimentation, using, for
example, exemplary embodiments described herein, that the
particles in wavefront 116 are at a zero-charge state and
approximately the same mass as an electron (9.10938188 *
10<'31> kilograms).
[0048] While reiterating that the precise theory of operation is
not entirely understood, it is believed that the effect is such
that when a wavefront of exemplary zero-charge particles with
sufficient energy density impinges a circuit, including a
semiconductor, for example, the kinetic energy of the particles,
rather than an associated electromagnetic charge, causes a type of
saturation of the semiconductor. It is possible that the
zero-charge particles impinging on semiconductor react with
impurities, e.g., metal oxides, present in the semiconductors, to
cause a resonant frequency. This resonant frequency may cause
mechanical or physical oscillations in a defect region of a
semiconductor, which in turn may cause electron flow to stop or
become greatly reduced because a physical travel path for the
electrons and/or holes (charge carriers) has been disrupted, e.g.,
in a gate region of the semiconductor. Experimental observations
have shown that a semiconductor may be temporarily disrupted for
the amount of time the zero-charge particles are impinging on the
semiconductor.
[0049] Unlike systems that rely exclusively on an electromagnetic
field or charged particles to gain access to protected equipment
for disruptive purposes, it is believed, based on experimental
observations, that an exemplary embodiment of a directed-energy
system using zero-charge particles can be an effective way to
defeat known countermeasure methods, such as Faraday cages,
[0050] The above description is presented to enable a person
skilled in the art to make and use the systems and methods
described herein, and is provided in the context of a particular
application and its requirements. Various modifications to the
embodiments will be readily apparent to those skilled in the art,
and the generic principles defined herein may be applied to other
embodiments and applications without departing from the spirit and
scope of the claims. Thus, there is no intention to be limited to
the embodiments shown, but rather to be accorded the widest scope
consistent with the principles and features disclosed herein.
USP Appln 2010128761
LOOK THROUGH MODE OF JAMMING
SYSTEM
2010-05-27
Inventor(s): CORNWELL JAMES
Classification: - international: H04K3/00;
H04L27/00; H04K3/00; H04L27/00 - European:
H04K3/00
Abstract -- A system
includes a generator and at least one device. The generator
includes a waveform oscillator and a blanking pulse generator.
Each device includes a transmit antenna, a receive antenna, an
antenna unit, a mixer and a detector. The antenna unit includes a
receiver coupled to the receive antenna, an amplifier coupled to
the receiver and a transmitter coupled to the transmit antenna and
the blanking pulse generator. The mixer has inputs coupled to the
amplifier and the waveform oscillator. The detector is coupled to
the mixer.
Description
BACKGROUND OF THE INVENTION
[0001] 1. Field of the Invention
[0002] The present invention relates to electronic countermeasure
jamming systems that are capable of interrupting radio links from
triggering devices used in connection with improvised explosive
devices. In particular, the invention related to a look through
mode for sensing the presence of radio links.
[0003] 2. Description Of Related
Art
[0004] Known countermeasure systems have diverse broadband radio
signal generators that are fed into a relatively simple antenna.
The antenna attempts to have omni-directional coverage. The
simplest antenna is a half dipole oriented vertically at the
center of the area to be protected by jamming The problem with
such antennas is that they do not have spherical coverage patterns
for truly omni coverage. Coverage of such a simple antenna appears
shaped like a donut with gaps in coverage above and below the
plane of the donut because the simple dipole cannot operate as
both an end fire antenna and an omni antenna. More complex
antennas may add coverage in end fire directions but generate
interference patterns that leave gaps in coverage.
[0005] In an environment where small improvised explosive devices
(IED) are placed in airplanes, busses or trains and triggered by
radio links distant from the IED, it becomes more important to
successfully jam the radio link without gaps in jamming system
coverage.
[0006] Known omni directional systems radiate to provide 360
degree coverage on a plane with elevations plus or minus of the
plane. Very few truly omni directional antenna systems are known
to create coverage in three dimensions on a unit sphere.
Difficulties are encountered that include, for example, the feed
point through the sphere causes distortion of the radiation
pattern, metal structures near the antenna cause reflections that
distort the radiation pattern, and the individual radiating
element of an antenna inherently does not produce a spherical
radiation pattern. In addition, providing a spherical radiation
pattern over a broad band of frequencies can be extremely
difficult. Antenna structures intended to shape the radiation
pattern at one frequency can cause distortion in the radiation
pattern at another frequency.
SUMMARY OF THE INVENTION
[0007] A system includes a generator and at least one device. The
generator includes a waveform oscillator and a blanking pulse
generator. Each device includes a transmit antenna, a receive
antenna, an antenna unit, a mixer and a detector. The antenna unit
includes a receiver coupled to the receive antenna, an amplifier
coupled to the receiver and a transmitter coupled to the transmit
antenna and the blanking pulse generator. The mixer has inputs
coupled to the amplifier and the waveform oscillator. The detector
is coupled to the mixer.
[0093] In yet another embodiment, frequency modulated waveform
signal 1292 is caused to dwell for a longer period at a particular
frequency to address an important threat within the band of any
one of the band specific modulators 1224, 1226, 1228. In FIG. 17,
there is depicted frequency modulated waveform signal 1300 that is
comprised of six segments: 1304, 1306, 1308, 1310, 1312 and 1314.
Segment 1304 has a relatively fast rise in frequency for a unit of
time when compared to segment 1306 that has a comparatively slower
rise in frequency for the same unit of time. Then, segment 1308
resumes the relatively fast rise in frequency per unit of time
that characterizes segment 1304. Segments 1310, 1312 and 1314 are
mirror symmetric conjugates of segments 1308, 1306 and 1304
respectively. This frequency modulated waveform signal 1300 is
repeated at a desired predetermined rate. A representative threat
table with only the scanning parameters is depicted in Table 1.
TABLE 1
Segment No. Start Freq. Stop Freq. Segment
Time Next Segment
1 3 MHz 315 MHz .45 milliseconds 2
2 315 MHz 320 MHz .05 milliseconds 3
3 320 MHz 400 MHz .25 milliseconds 4
4 400 MHz 320 MHz .25 milliseconds 5
5 320 MHz 315 MHz .05 milliseconds 6
6 315 MHz 3 MHz .45 milliseconds 1
US7221329
Enhanced Beam Antenna
Classification: - international: H01J1/02;
H01J1/02; (IPC1-7): H01J1/02
Abstract -- A reflector
includes a conductive surface and a surface coating. The surface
coating includes a binder and metal oxide grains embedded in the
binder. The metal oxide grains include aluminum oxide that
constitute up to 60% of the metal oxide by weight. A method of
making a reflector includes forming a slurry, applying an electric
field between a spray gun nozzle and the reflector, and spraying
the slurry through the spray gun nozzle onto the reflector. The
slurry contains metal oxide grains suspended in a binder.